By using SLT to perform functional testing on the test chip in a simulated terminal environment, equipment manufacturers can prevent missed detection faults that are difficult to detect using traditional wafer and packaging testing techniques.

HAST testing is a testing method used to evaluate the reliability and lifespan of products under high temperature, high humidity, and high pressure conditions.

System level testing (SLT) refers to testing the device under test (DUT) in simulated terminal usage scenarios

Chip HAST testing is a testing method used to evaluate the reliability and lifespan of products under high temperature, high humidity, and high pressure conditions.

The ZONGLEN heat flow meter is compatible with various brands of optical testing equipment on the market, and can complete optical performance testing in high and low temperature environments. It is an essential component of optical testing equipment

Common non constant stress spectra and combined stresses include: step stress tests; Progressive stress test; High Acceleration Life Test (HALT) (equipment level); High Acceleration Stress Screening (HASS) (equipment level); High Acceleration Temperature and Humidity Stress Test (HAST) (Part Level).

As an important component of optical communication, optical modules are optoelectronic devices that realize the conversion of light and electricity during the transmission of optical signals.

The CP chip test that must be conducted before slicing, on the one hand, verifies whether the various parameters and functions of the IC meet the design requirements, and on the other hand, marks the IC with failed parameters or functions from it