In the reliability verification of microelectronic devices, temperature cycling (TC) and thermal shock (TS) are two crucial environmental stress tests.

Three temperature testing refers to the performance testing of chips under three different temperature conditions (normal temperature, low temperature, high temperature), aiming to comprehensively evaluate the reliability and stability of chips under different environmental temperatures.

The PCW system, also known as the process cooling water system, is a critical water circulation system used in industrial production to provide cooling for equipment and machinery.

In the field of electronic product reliability testing, HAST (Highly Accelerated Stress Test) and PCT (Pressure Cooker Test) are two commonly used high-temperature and high humidity accelerated aging testing methods.

What are the differences between THB (Double 85), BHAST, and UHAST? HAST and THB can be selectively validated; If THB or HAST is done, UHAST can be omitted.

Chiller ZC209 is a device that controls the temperature of circulating fluid and outputs cold and hot fluids.

In order to investigate the compatibility and reliability of copper (Cu) interconnects with glass substrates with different chemical properties, we prepared copper test structures on different glass substrates and conducted biased high acceleration stress testing (HAST).

The working principle of the wafer probe station is to achieve the transmission and measurement of electrical signals by contacting a set of micro probes with the testing points of the chip. These probes are usually made of metal materials and can be positioned with micrometer level accuracy.