Wafer back cooling basically uses helium gas for cooling, because helium gas in the gas phase has outstanding chemical inertness, and its thermal conductivity and specific heat capacity are greater than any other gas except hydrogen gas.

The sharp increase in energy consumption of optical modules has brought enormous pressure to the cost side of data centers, and solving its energy consumption problem has become the key to the current update of optical module technology.

Temperature cycling test, temperature shock test, and thermal shock test are used to simulate and evaluate the performance of optical modules under high and low temperature shocks.

The AEQ quality standard is one of the most relevant standards for automotive electronics in the automotive industry. AEC-Q100 is a failure mechanism based on stress testing of packaged integrated circuits.

Optical module, also known as optical transceiver integrated module, is the core component that realizes the conversion of optical and electrical signals in optical communication systems. It mainly consists of optical devices, functional circuits, and optical interfaces.

As a core component of automobiles, strict testing of automotive grade chips is an important means to ensure the quality and safety of automobiles.

AEC-Q is a reliability testing standard for vehicles, mainly aimed at strict quality and reliability confirmation of on-board chips, especially for standard specification testing of product functions and performance.

High Accelerated Damp Heat Test (HAST), as an effective testing method, plays a crucial role in evaluating the weather resistance performance of fluorinated photovoltaic backboards.